VCS 500N10

Surge pulses occur due to direct or indirect lightning strokes to an external (outdoor) circuit. This leads to currents or electromagnetic fields causing high voltage or current transients. Another source for surge pulses are switching transients originating from switching disturbances and systems faults.
Due to the characteristic of the phenomenon nearly every electrical and electronical device may suffer from such lightning events which justifies the necessity of surge tests being widely performed. Surge voltage can reach several thousands of volts and surge current is seen to reach several thousands of amps.

The VCS 500N10 combination wave simulator generates surge voltages up to 10kV and surge currents up to 5kVA as it is required for components testing (e.g. overvoltage protection for telecommunication devices). To apply the surge pulse to power supply lines an external coupling/decoupling network either single phase or three-phase can be connected. The coupling modes and the source impedance are set automatically controlled by the VCS 500N10.
Fail inputs are offered as standard for DUT monitoring purposes. Peak values of voltage and current are shown in the display and these values are transferred to the software for reporting.
To comply with safety regulations the VCS 500N10 is equipped with a contact to control warning lamps and with a safety interlock.
Pre-programmed Standard Test routines allow highest user convenience. Still the VCS 500N10 offers the Quick Start test routine where parameters can be changed on-line during the test to evaluate the susceptibility level of an individual DUT.

Front panel menu and function keys enable the user to program his test routines quickly and accurately. The cursor allows fast control of all test parameters of the programmed routine, thus test procedures are simplified and confidence is generated that every step is carried out correctly.

Outstanding user convenience, clearly structured windows and operation features and the EM TEST standards library along with the flexibility to generate user specific test sequences very easily are the main features of iec.control software. The software is automatically configured according to the connected EM TEST generators. Extensive reporting capabilities help the user to create test reports that meet international requirements.
iec.control is supported by Windows 2000, Windows XP, Windows Vista and Windows 7. Remote control is achieved either via USB or GPIB. iec.control supports a wide range of GPIB cards of National Instruments.